TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_48_41
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-025-11 | FUSED_ID : 6359364768406479259
  IC_TEMP :  -53.49 | VDDM : 1113.90 | AUX_INT :   -7.42 | CsaBias :   96.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19566e-03 / 2
  ADC_P0  : -7.42382e-03 ± 2.34411e-02
  ADC_P1  : 8.04035e-03 ± 5.57754e-04
  ADC_P2  : -5.20012e-06 ± 2.62353e-06
  CSA_Chi2/NDF : 1.30216e-04 / 2
  CSA_P0  : 5.80346e-02 ± 7.61123e-03
  CSA_P1  : 9.72864e-03 ± 5.73452e-04
  CSA_P2  : -4.16956e-05 ± 8.73299e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [81, 99, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2670', '1.800', '0.1583', '1.800', '0.0913', '7.000', '0.7079', 1, 1, 1, 1, 1727275721.498287]
VI_after__Init : ['1.201', '0.2671', '1.800', '0.1583', '1.801', '0.0859', '7.000', '0.7078', 1, 1, 1, 1, 1727275729.6556067]
VI_at__the_End : ['1.201', '0.5014', '1.800', '0.1350', '1.802', '0.1104', '7.000', '0.7086', 1, 1, 1, 1, 1727275789.8210092]