TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_50_19
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-010-026-11 | FUSED_ID : 6359364768406479275
  IC_TEMP :  -61.24 | VDDM : 1122.49 | AUX_INT :   -8.09 | CsaBias :   80.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.19756e-03 / 2
  ADC_P0  : -8.08794e-03 ± 2.34495e-02
  ADC_P1  : 8.06996e-03 ± 5.56813e-04
  ADC_P2  : -5.27363e-06 ± 2.62158e-06
  CSA_Chi2/NDF : 1.14318e-04 / 2
  CSA_P0  : 5.84710e-02 ± 7.13148e-03
  CSA_P1  : 9.64441e-03 ± 5.37305e-04
  CSA_P2  : -4.41701e-05 ± 8.18252e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [1, 90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3196', '1.800', '0.1350', '1.800', '0.0906', '7.000', '0.7090', 1, 1, 1, 1, 1727275819.0897982]
VI_after__Init : ['1.201', '0.3196', '1.800', '0.1350', '1.800', '0.0832', '7.000', '0.7079', 1, 1, 1, 1, 1727275827.945112]
VI_at__the_End : ['1.202', '0.4871', '1.800', '0.1354', '1.803', '0.1130', '7.000', '0.7086', 1, 1, 1, 1, 1727275887.5997074]