TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_34_18
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-002-01 | FUSED_ID : 6359364768406482977
  IC_TEMP :  -58.57 | VDDM : 1127.87 | AUX_INT :   -5.78 | CsaBias :   73.53
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.17304e-04 / 2
  ADC_P0  : -5.77891e-03 ± 1.67527e-02
  ADC_P1  : 8.87841e-03 ± 4.32052e-04
  ADC_P2  : -7.31125e-06 ± 2.18816e-06
  CSA_Chi2/NDF : 1.24052e-04 / 2
  CSA_P0  : 5.98038e-02 ± 7.42889e-03
  CSA_P1  : 1.00046e-02 ± 5.59713e-04
  CSA_P2  : -4.59232e-05 ± 8.52377e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [3]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [39]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2399', '1.800', '0.1386', '1.800', '0.0849', '7.000', '0.7075', 1, 1, 1, 1, 1727278458.693303]
VI_after__Init : ['1.201', '0.2399', '1.800', '0.1386', '1.801', '0.0793', '7.000', '0.7075', 1, 1, 1, 1, 1727278466.8696861]
VI_at__the_End : ['1.202', '0.5039', '1.800', '0.1417', '1.805', '0.1134', '7.000', '0.7085', 1, 1, 1, 1, 1727278529.818898]