TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_32_41
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-003-01 | FUSED_ID : 6359364768406482993
  IC_TEMP :  -65.03 | VDDM : 1123.62 | AUX_INT :  -10.49 | CsaBias :   91.52
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.73562e-03 / 2
  ADC_P0  : -1.04863e-02 ± 2.82072e-02
  ADC_P1  : 8.58208e-03 ± 6.88767e-04
  ADC_P2  : -6.80894e-06 ± 3.34280e-06
  CSA_Chi2/NDF : 1.06191e-04 / 2
  CSA_P0  : 5.88226e-02 ± 6.87331e-03
  CSA_P1  : 9.67786e-03 ± 5.17854e-04
  CSA_P2  : -4.38890e-05 ± 7.88631e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [12, 88]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [35, 76, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3383', '1.800', '0.1475', '1.800', '0.0984', '7.000', '0.7073', 1, 1, 1, 1, 1727278361.1897352]
VI_after__Init : ['1.202', '0.3384', '1.800', '0.1475', '1.800', '0.0926', '7.000', '0.7076', 1, 1, 1, 1, 1727278369.133173]
VI_at__the_End : ['1.202', '0.4899', '1.800', '0.1408', '1.800', '0.1163', '7.000', '0.7083', 1, 1, 1, 1, 1727278427.3187983]