TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_31_03
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-004-01 | FUSED_ID : 6359364768406483009
  IC_TEMP :  -60.86 | VDDM : 1120.46 | AUX_INT :   -9.45 | CsaBias :   65.11
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55130e-03 / 2
  ADC_P0  : -9.44551e-03 ± 2.66982e-02
  ADC_P1  : 8.33732e-03 ± 6.45609e-04
  ADC_P2  : -5.94554e-06 ± 3.10004e-06
  CSA_Chi2/NDF : 1.63315e-04 / 2
  CSA_P0  : 5.97199e-02 ± 8.52385e-03
  CSA_P1  : 1.03632e-02 ± 6.42211e-04
  CSA_P2  : -5.10712e-05 ± 9.78011e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [15, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3752', '1.800', '0.1571', '1.800', '0.0918', '7.000', '0.7076', 1, 1, 1, 1, 1727278263.5043108]
VI_after__Init : ['1.202', '0.3753', '1.800', '0.1571', '1.800', '0.0859', '7.000', '0.7073', 1, 1, 1, 1, 1727278271.6197684]
VI_at__the_End : ['1.202', '0.5040', '1.800', '0.1402', '1.800', '0.1130', '7.000', '0.7083', 1, 1, 1, 1, 1727278331.387149]