TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_29_26
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-005-01 | FUSED_ID : 6359364768406483025
  IC_TEMP :  -59.47 | VDDM : 1118.91 | AUX_INT :   -8.12 | CsaBias :   74.99
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.09631e-03 / 2
  ADC_P0  : -8.11661e-03 ± 2.24012e-02
  ADC_P1  : 8.37094e-03 ± 5.46174e-04
  ADC_P2  : -6.00807e-06 ± 2.63882e-06
  CSA_Chi2/NDF : 1.59108e-04 / 2
  CSA_P0  : 5.87313e-02 ± 8.41334e-03
  CSA_P1  : 1.02951e-02 ± 6.33884e-04
  CSA_P2  : -5.06665e-05 ± 9.65331e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [23]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4179', '1.800', '0.1894', '1.800', '0.0994', '7.000', '0.7072', 1, 1, 1, 1, 1727278165.6668332]
VI_after__Init : ['1.201', '0.4186', '1.800', '0.1895', '1.800', '0.0936', '7.000', '0.7076', 1, 1, 1, 1, 1727278174.427185]
VI_at__the_End : ['1.202', '0.4991', '1.800', '0.1408', '1.800', '0.1125', '7.000', '0.7080', 1, 1, 1, 1, 1727278236.3365161]