TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_24_33
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-008-01 | FUSED_ID : 6359364768406483073
  IC_TEMP :  -59.59 | VDDM : 1124.56 | AUX_INT :  -64.53 | CsaBias :   35.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43978e-03 / 2
  ADC_P0  : -6.45313e-02 ± 2.86394e-02
  ADC_P1  : 9.17297e-03 ± 6.83232e-04
  ADC_P2  : -8.59742e-06 ± 3.21866e-06
  CSA_Chi2/NDF : 1.32526e-04 / 2
  CSA_P0  : 5.92843e-02 ± 7.67843e-03
  CSA_P1  : 9.70180e-03 ± 5.78514e-04
  CSA_P2  : -4.57973e-05 ± 8.81009e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [47, 95]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [3, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2156', '1.800', '0.1631', '1.800', '0.0856', '7.000', '0.7072', 1, 1, 1, 1, 1727277872.6742675]
VI_after__Init : ['1.201', '0.2156', '1.800', '0.1631', '1.800', '0.0801', '7.000', '0.7073', 1, 1, 1, 1, 1727277881.435689]
VI_at__the_End : ['1.201', '0.4847', '1.800', '0.1387', '1.800', '0.1146', '7.000', '0.7079', 1, 1, 1, 1, 1727277941.9200356]