TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_22_55
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-009-01 | FUSED_ID : 6359364768406483089
  IC_TEMP :  -57.41 | VDDM : 1118.72 | AUX_INT :   -9.90 | CsaBias :   89.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62072e-03 / 2
  ADC_P0  : -9.90425e-03 ± 2.72688e-02
  ADC_P1  : 8.37829e-03 ± 6.55919e-04
  ADC_P2  : -6.27069e-06 ± 3.13502e-06
  CSA_Chi2/NDF : 1.14311e-04 / 2
  CSA_P0  : 5.98129e-02 ± 7.13126e-03
  CSA_P1  : 9.55551e-03 ± 5.37289e-04
  CSA_P2  : -4.19425e-05 ± 8.18227e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [53, 67, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2342', '1.800', '0.1572', '1.800', '0.0930', '7.000', '0.7077', 1, 1, 1, 1, 1727277775.1357627]
VI_after__Init : ['1.202', '0.2343', '1.800', '0.1572', '1.800', '0.0858', '7.000', '0.7072', 1, 1, 1, 1, 1727277783.1331317]
VI_at__the_End : ['1.201', '0.4938', '1.800', '0.1394', '1.800', '0.1135', '7.000', '0.7079', 1, 1, 1, 1, 1727277845.0524144]