TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_21_17
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-010-01 | FUSED_ID : 6359364768406483105
  IC_TEMP :  -58.93 | VDDM : 1127.87 | AUX_INT :   -7.83 | CsaBias :   76.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.12917e-03 / 2
  ADC_P0  : -7.83415e-03 ± 2.27348e-02
  ADC_P1  : 8.53537e-03 ± 5.64063e-04
  ADC_P2  : -6.42689e-06 ± 2.76532e-06
  CSA_Chi2/NDF : 1.21540e-04 / 2
  CSA_P0  : 5.85100e-02 ± 7.35329e-03
  CSA_P1  : 9.99139e-03 ± 5.54017e-04
  CSA_P2  : -4.69855e-05 ± 8.43703e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [87, 106]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2375', '1.800', '0.1804', '1.800', '0.0927', '7.000', '0.7072', 1, 1, 1, 1, 1727277677.2511566]
VI_after__Init : ['1.201', '0.2376', '1.800', '0.1804', '1.800', '0.0870', '7.000', '0.7069', 1, 1, 1, 1, 1727277685.2446332]
VI_at__the_End : ['1.201', '0.4976', '1.800', '0.1403', '1.800', '0.1128', '7.000', '0.7080', 1, 1, 1, 1, 1727277744.572091]