TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_16_24
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-013-01 | FUSED_ID : 6359364768406483153
  IC_TEMP :  -54.87 | VDDM : 1125.55 | AUX_INT :   -9.08 | CsaBias :   89.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34306e-03 / 2
  ADC_P0  : -9.08385e-03 ± 2.48049e-02
  ADC_P1  : 8.30157e-03 ± 5.94630e-04
  ADC_P2  : -6.06364e-06 ± 2.82923e-06
  CSA_Chi2/NDF : 5.83839e-05 / 2
  CSA_P0  : 5.91117e-02 ± 5.09646e-03
  CSA_P1  : 9.29776e-03 ± 3.83982e-04
  CSA_P2  : -3.80911e-05 ± 5.84759e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [73, 97, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3009', '1.800', '0.1502', '1.800', '0.0872', '7.000', '0.7069', 1, 1, 1, 1, 1727277383.592668]
VI_after__Init : ['1.201', '0.3010', '1.800', '0.1502', '1.800', '0.0816', '7.000', '0.7069', 1, 1, 1, 1, 1727277392.4040086]
VI_at__the_End : ['1.201', '0.4910', '1.800', '0.1363', '1.800', '0.1111', '7.000', '0.7076', 1, 1, 1, 1, 1727277455.290238]