TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_14_46
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-014-01 | FUSED_ID : 6359364768406483169
  IC_TEMP :  -57.07 | VDDM : 1120.68 | AUX_INT :  -17.65 | CsaBias :   71.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.52749e-03 / 2
  ADC_P0  : -1.76452e-02 ± 2.69476e-02
  ADC_P1  : 8.19973e-03 ± 6.33360e-04
  ADC_P2  : -5.78715e-06 ± 2.95505e-06
  CSA_Chi2/NDF : 1.17306e-04 / 2
  CSA_P0  : 5.71408e-02 ± 7.22406e-03
  CSA_P1  : 9.88560e-03 ± 5.44281e-04
  CSA_P2  : -4.68443e-05 ± 8.28876e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [86]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [41, 97, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3089', '1.800', '0.1358', '1.800', '0.0939', '7.000', '0.7069', 1, 1, 1, 1, 1727277285.5512712]
VI_after__Init : ['1.202', '0.3096', '1.800', '0.1359', '1.801', '0.0887', '7.000', '0.7072', 1, 1, 1, 1, 1727277294.3974802]
VI_at__the_End : ['1.201', '0.4900', '1.800', '0.1376', '1.800', '0.1123', '7.000', '0.7075', 1, 1, 1, 1, 1727277357.856738]