TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_13_08
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-015-01 | FUSED_ID : 6359364768406483185
  IC_TEMP :  -54.15 | VDDM : 1123.97 | AUX_INT :   -7.54 | CsaBias :   80.14
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.14691e-03 / 2
  ADC_P0  : -7.53531e-03 ± 2.29649e-02
  ADC_P1  : 8.02532e-03 ± 5.48161e-04
  ADC_P2  : -4.94942e-06 ± 2.59246e-06
  CSA_Chi2/NDF : 1.00343e-04 / 2
  CSA_P0  : 5.83937e-02 ± 6.68139e-03
  CSA_P1  : 9.97089e-03 ± 5.03394e-04
  CSA_P2  : -4.73242e-05 ± 7.66610e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [21, 39, 47]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2970', '1.800', '0.1746', '1.800', '0.0912', '7.000', '0.7070', 1, 1, 1, 1, 1727277188.0746582]
VI_after__Init : ['1.201', '0.2972', '1.800', '0.1746', '1.800', '0.0859', '7.000', '0.7072', 1, 1, 1, 1, 1727277196.249064]
VI_at__the_End : ['1.201', '0.4924', '1.800', '0.1387', '1.804', '0.1140', '7.000', '0.7078', 1, 1, 1, 1, 1727277263.3119268]