TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_11_30
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-016-06 | FUSED_ID : 6359364768406483206
  IC_TEMP :  -58.02 | VDDM : 1126.50 | AUX_INT :   -9.37 | CsaBias :   75.03
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44106e-03 / 2
  ADC_P0  : -9.36959e-03 ± 2.56749e-02
  ADC_P1  : 8.50773e-03 ± 6.22827e-04
  ADC_P2  : -6.80874e-06 ± 2.99239e-06
  CSA_Chi2/NDF : 8.68996e-05 / 2
  CSA_P0  : 5.96275e-02 ± 6.21772e-03
  CSA_P1  : 9.56598e-03 ± 4.68460e-04
  CSA_P2  : -4.23312e-05 ± 7.13410e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [1, 49]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [9]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2484', '1.800', '0.1326', '1.800', '0.0828', '7.000', '0.7073', 1, 1, 1, 1, 1727277090.1271677]
VI_after__Init : ['1.202', '0.2485', '1.800', '0.1326', '1.800', '0.0771', '7.000', '0.7072', 1, 1, 1, 1, 1727277098.8365228]
VI_at__the_End : ['1.201', '0.4911', '1.800', '0.1377', '1.800', '0.1132', '7.000', '0.7077', 1, 1, 1, 1, 1727277164.4704778]