TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_08_14
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-018-06 | FUSED_ID : 6359364768406483238
  IC_TEMP :  -56.55 | VDDM : 1127.52 | AUX_INT :   -7.79 | CsaBias :   75.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.55909e-04 / 2
  ADC_P0  : -7.78998e-03 ± 2.08793e-02
  ADC_P1  : 8.35588e-03 ± 5.03046e-04
  ADC_P2  : -6.38785e-06 ± 2.39507e-06
  CSA_Chi2/NDF : 1.00428e-04 / 2
  CSA_P0  : 5.75083e-02 ± 6.68420e-03
  CSA_P1  : 9.61378e-03 ± 5.03606e-04
  CSA_P2  : -4.23450e-05 ± 7.66933e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [43, 58, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1827', '1.800', '0.1828', '1.800', '0.0830', '7.000', '0.7076', 1, 1, 1, 1, 1727276894.3901339]
VI_after__Init : ['1.202', '0.1827', '1.800', '0.1826', '1.800', '0.0779', '7.000', '0.7075', 1, 1, 1, 1, 1727276902.4695158]
VI_at__the_End : ['1.201', '0.4916', '1.800', '0.1402', '1.801', '0.1140', '7.000', '0.7079', 1, 1, 1, 1, 1727276968.514448]