TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_06_36
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-019-06 | FUSED_ID : 6359364768406483254
  IC_TEMP :  -49.62 | VDDM : 1120.00 | AUX_INT :   -8.15 | CsaBias :   77.01
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.31136e-03 / 2
  ADC_P0  : -8.15417e-03 ± 2.45740e-02
  ADC_P1  : 7.79311e-03 ± 5.68656e-04
  ADC_P2  : -4.63825e-06 ± 2.61065e-06
  CSA_Chi2/NDF : 6.06383e-05 / 2
  CSA_P0  : 5.69817e-02 ± 5.19393e-03
  CSA_P1  : 8.96969e-03 ± 3.91325e-04
  CSA_P2  : -3.51634e-05 ± 5.95941e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [1, 32]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [65, 95]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2680', '1.800', '0.1355', '1.800', '0.0913', '7.000', '0.7074', 1, 1, 1, 1, 1727276796.326625]
VI_after__Init : ['1.202', '0.2684', '1.800', '0.1356', '1.800', '0.0858', '7.000', '0.7073', 1, 1, 1, 1, 1727276804.349933]
VI_at__the_End : ['1.201', '0.4788', '1.800', '0.1351', '1.800', '0.1113', '7.000', '0.7083', 1, 1, 1, 1, 1727276869.4489708]