TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_04_58
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-020-06 | FUSED_ID : 6359364768406483270
  IC_TEMP :  -60.40 | VDDM : 1122.06 | AUX_INT :   -8.12 | CsaBias :   76.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08484e-03 / 2
  ADC_P0  : -8.11991e-03 ± 2.22982e-02
  ADC_P1  : 8.50749e-03 ± 5.56854e-04
  ADC_P2  : -5.88597e-06 ± 2.76104e-06
  CSA_Chi2/NDF : 1.31547e-04 / 2
  CSA_P0  : 6.00574e-02 ± 7.65003e-03
  CSA_P1  : 1.01089e-02 ± 5.76375e-04
  CSA_P2  : -4.94249e-05 ± 8.77750e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [38]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.4096', '1.800', '0.1398', '1.799', '0.0975', '7.000', '0.7074', 1, 1, 1, 1, 1727276698.051054]
VI_after__Init : ['1.202', '0.4098', '1.800', '0.1399', '1.801', '0.0917', '7.000', '0.7077', 1, 1, 1, 1, 1727276706.2434616]
VI_at__the_End : ['1.202', '0.4955', '1.800', '0.1398', '1.803', '0.1139', '7.000', '0.7083', 1, 1, 1, 1, 1727276765.8259075]