TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_01_42
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-022-06 | FUSED_ID : 6359364768406483302
  IC_TEMP :  -61.98 | VDDM : 1119.46 | AUX_INT :   -9.20 | CsaBias :   81.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35453e-03 / 2
  ADC_P0  : -9.19524e-03 ± 2.49105e-02
  ADC_P1  : 8.30670e-03 ± 5.97162e-04
  ADC_P2  : -6.07760e-06 ± 2.84128e-06
  CSA_Chi2/NDF : 1.55840e-04 / 2
  CSA_P0  : 6.01977e-02 ± 8.32648e-03
  CSA_P1  : 1.02649e-02 ± 6.27340e-04
  CSA_P2  : -5.15305e-05 ± 9.55364e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [38, 80]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2925', '1.800', '0.1738', '1.800', '0.0946', '7.000', '0.7076', 1, 1, 1, 1, 1727276502.002067]
VI_after__Init : ['1.201', '0.2925', '1.799', '0.1735', '1.800', '0.0889', '7.000', '0.7079', 1, 1, 1, 1, 1727276510.9813342]
VI_at__the_End : ['1.202', '0.5008', '1.800', '0.1412', '1.807', '0.1154', '7.000', '0.7083', 1, 1, 1, 1, 1727276575.069517]