TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_00_04
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-023-06 | FUSED_ID : 6359364768406483318
  IC_TEMP :  -54.27 | VDDM : 1119.40 | AUX_INT :   -9.68 | CsaBias :   90.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.83754e-03 / 2
  ADC_P0  : -9.68237e-03 ± 2.91194e-02
  ADC_P1  : 7.79608e-03 ± 6.65252e-04
  ADC_P2  : -4.86442e-06 ± 3.02315e-06
  CSA_Chi2/NDF : 8.89734e-05 / 2
  CSA_P0  : 5.59589e-02 ± 6.29147e-03
  CSA_P1  : 8.96482e-03 ± 4.74017e-04
  CSA_P2  : -3.50326e-05 ± 7.21872e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [34, 98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2795', '1.800', '0.1382', '1.800', '0.0878', '7.000', '0.7079', 1, 1, 1, 1, 1727276404.0935175]
VI_after__Init : ['1.201', '0.2795', '1.800', '0.1383', '1.800', '0.0822', '7.000', '0.7079', 1, 1, 1, 1, 1727276412.314844]
VI_at__the_End : ['1.202', '0.4791', '1.800', '0.1349', '1.800', '0.1128', '7.000', '0.7083', 1, 1, 1, 1, 1727276475.5830166]