TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_58_27
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-024-06 | FUSED_ID : 6359364768406483334
  IC_TEMP :  -58.94 | VDDM : 1112.94 | AUX_INT :  -74.30 | CsaBias :   17.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.50706e-03 / 2
  ADC_P0  : -7.43000e-02 ± 2.97944e-02
  ADC_P1  : 9.24563e-03 ± 6.98107e-04
  ADC_P2  : -9.15959e-06 ± 3.22719e-06
  CSA_Chi2/NDF : 1.67486e-04 / 2
  CSA_P0  : 5.76057e-02 ± 8.63201e-03
  CSA_P1  : 1.02178e-02 ± 6.50360e-04
  CSA_P2  : -5.13640e-05 ± 9.90421e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [61, 107, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3371', '1.800', '0.1512', '1.800', '0.0887', '7.000', '0.7079', 1, 1, 1, 1, 1727276307.0358372]
VI_after__Init : ['1.201', '0.3372', '1.800', '0.1513', '1.800', '0.0831', '7.000', '0.7079', 1, 1, 1, 1, 1727276315.1893387]
VI_at__the_End : ['1.201', '0.4920', '1.800', '0.1369', '1.800', '0.1131', '7.000', '0.7085', 1, 1, 1, 1, 1727276374.0278218]