TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_56_50
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-025-06 | FUSED_ID : 6359364768406483350
  IC_TEMP :  -51.12 | VDDM : 1101.90 | AUX_INT :   -8.64 | CsaBias :   87.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26188e-03 / 2
  ADC_P0  : -8.64419e-03 ± 2.40534e-02
  ADC_P1  : 8.11438e-03 ± 5.68181e-04
  ADC_P2  : -5.59404e-06 ± 2.66307e-06
  CSA_Chi2/NDF : 1.01549e-04 / 2
  CSA_P0  : 5.69318e-02 ± 6.72140e-03
  CSA_P1  : 9.58810e-03 ± 5.06409e-04
  CSA_P2  : -4.00458e-05 ± 7.71201e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [25]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [47]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.5036', '1.800', '0.1714', '1.800', '0.0941', '7.000', '0.7090', 1, 1, 1, 1, 1727276209.9583228]
VI_after__Init : ['1.201', '0.5039', '1.800', '0.1716', '1.800', '0.0867', '7.000', '0.7080', 1, 1, 1, 1, 1727276218.2257156]
VI_at__the_End : ['1.201', '0.4963', '1.800', '0.1366', '1.800', '0.1100', '7.000', '0.7088', 1, 1, 1, 1, 1727276281.569841]