TEST_NAME : Wafer
TEST_DATE : 24_09_25-16_55_12
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-011-026-06 | FUSED_ID : 6359364768406483366
  IC_TEMP :  -48.66 | VDDM : 1121.44 | AUX_INT :   -7.83 | CsaBias :   87.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02494e-03 / 2
  ADC_P0  : -7.82571e-03 ± 2.16621e-02
  ADC_P1  : 8.04124e-03 ± 5.10017e-04
  ADC_P2  : -5.40436e-06 ± 2.37985e-06
  CSA_Chi2/NDF : 6.22106e-05 / 2
  CSA_P0  : 5.68253e-02 ± 5.26083e-03
  CSA_P1  : 9.07070e-03 ± 3.96366e-04
  CSA_P2  : -3.33866e-05 ± 6.03618e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [65]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [37]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3287', '1.800', '0.1438', '1.799', '0.0858', '7.000', '0.7081', 1, 1, 1, 1, 1727276112.2747498]
VI_after__Init : ['1.201', '0.3289', '1.800', '0.1439', '1.799', '0.0810', '7.000', '0.7080', 1, 1, 1, 1, 1727276120.2840776]
VI_at__the_End : ['1.201', '0.4930', '1.800', '0.1358', '1.800', '0.1100', '7.000', '0.7086', 1, 1, 1, 1, 1727276184.3152497]