TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_37_34
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-012-003-09 | FUSED_ID : 6359364768406487097
  IC_TEMP :  -58.63 | VDDM : 1126.48 | AUX_INT :   -8.36 | CsaBias :   76.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30365e-03 / 2
  ADC_P0  : -8.36056e-03 ± 2.44737e-02
  ADC_P1  : 8.55939e-03 ± 6.14675e-04
  ADC_P2  : -6.02392e-06 ± 3.05928e-06
  CSA_Chi2/NDF : 1.14817e-04 / 2
  CSA_P0  : 6.04695e-02 ± 7.14702e-03
  CSA_P1  : 9.85901e-03 ± 5.38476e-04
  CSA_P2  : -4.39204e-05 ± 8.20035e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [10, 80, 101]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2184', '1.800', '0.1548', '1.800', '0.0866', '7.000', '0.7079', 1, 1, 1, 1, 1727278654.7102826]
VI_after__Init : ['1.202', '0.2184', '1.800', '0.1548', '1.800', '0.0810', '7.000', '0.7077', 1, 1, 1, 1, 1727278662.7717462]
VI_at__the_End : ['1.201', '0.5036', '1.800', '0.1398', '1.800', '0.1136', '7.000', '0.7083', 1, 1, 1, 1, 1727278723.258036]