TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_39_12
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-012-004-09 | FUSED_ID : 6359364768406487113
  IC_TEMP :  -55.74 | VDDM : 1126.93 | AUX_INT :   -9.00 | CsaBias :   79.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.77936e-03 / 2
  ADC_P0  : -8.99765e-03 ± 2.87247e-02
  ADC_P1  : 8.11841e-03 ± 7.04522e-04
  ADC_P2  : -4.24457e-06 ± 3.44736e-06
  CSA_Chi2/NDF : 1.45131e-04 / 2
  CSA_P0  : 5.91573e-02 ± 8.03530e-03
  CSA_P1  : 1.03325e-02 ± 6.05402e-04
  CSA_P2  : -5.00269e-05 ± 9.21956e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [47, 60]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [34, 81, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4965', '1.800', '0.1636', '1.800', '0.0947', '7.000', '0.7075', 1, 1, 1, 1, 1727278751.7929025]
VI_after__Init : ['1.201', '0.4968', '1.799', '0.1637', '1.800', '0.0889', '7.000', '0.7076', 1, 1, 1, 1, 1727278760.4612103]
VI_at__the_End : ['1.201', '0.5074', '1.800', '0.1413', '1.799', '0.1114', '7.000', '0.7083', 1, 1, 1, 1, 1727278818.8616664]