TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_40_49
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-012-005-09 | FUSED_ID : 6359364768406487129
  IC_TEMP :  -54.77 | VDDM : 1103.19 | AUX_INT :   -7.30 | CsaBias :   83.56
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02935e-03 / 2
  ADC_P0  : -7.30412e-03 ± 2.17161e-02
  ADC_P1  : 8.32516e-03 ± 5.30620e-04
  ADC_P2  : -5.85367e-06 ± 2.56132e-06
  CSA_Chi2/NDF : 9.30230e-05 / 2
  CSA_P0  : 6.00700e-02 ± 6.43306e-03
  CSA_P1  : 9.30843e-03 ± 4.84684e-04
  CSA_P2  : -3.65933e-05 ± 7.38117e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [12, 52, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2393', '1.800', '0.1676', '1.800', '0.0906', '7.000', '0.7076', 1, 1, 1, 1, 1727278849.5464263]
VI_after__Init : ['1.201', '0.2394', '1.800', '0.1676', '1.799', '0.0850', '7.000', '0.7076', 1, 1, 1, 1, 1727278857.5698218]
VI_at__the_End : ['1.201', '0.4972', '1.800', '0.1411', '1.800', '0.1114', '7.000', '0.7084', 1, 1, 1, 1, 1727278920.3529434]