TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_45_42
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-012-008-09 | FUSED_ID : 6359364768406487177
  IC_TEMP :  -55.58 | VDDM : 1110.61 | AUX_INT :   -8.63 | CsaBias :   91.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26636e-03 / 2
  ADC_P0  : -8.62972e-03 ± 2.41199e-02
  ADC_P1  : 8.39291e-03 ± 5.95219e-04
  ADC_P2  : -5.61124e-06 ± 2.91895e-06
  CSA_Chi2/NDF : 1.03075e-04 / 2
  CSA_P0  : 6.15216e-02 ± 6.77172e-03
  CSA_P1  : 9.98176e-03 ± 5.10200e-04
  CSA_P2  : -4.46721e-05 ± 7.76974e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [61, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [96]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3652', '1.800', '0.1455', '1.799', '0.0929', '7.000', '0.7084', 1, 1, 1, 1, 1727279142.4338934]
VI_after__Init : ['1.201', '0.3652', '1.800', '0.1454', '1.800', '0.0856', '7.000', '0.7076', 1, 1, 1, 1, 1727279150.4373302]
VI_at__the_End : ['1.202', '0.5095', '1.800', '0.1407', '1.800', '0.1112', '7.000', '0.7085', 1, 1, 1, 1, 1727279210.4037182]