TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_47_20
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-012-009-09 | FUSED_ID : 6359364768406487193
  IC_TEMP :  -49.70 | VDDM : 1118.25 | AUX_INT :   -8.59 | CsaBias :   92.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36319e-03 / 2
  ADC_P0  : -8.58791e-03 ± 2.50374e-02
  ADC_P1  : 7.83080e-03 ± 5.76458e-04
  ADC_P2  : -4.92525e-06 ± 2.63494e-06
  CSA_Chi2/NDF : 7.63560e-05 / 2
  CSA_P0  : 5.69622e-02 ± 5.82833e-03
  CSA_P1  : 9.58389e-03 ± 4.39122e-04
  CSA_P2  : -3.94214e-05 ± 6.68731e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [53]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [70]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1572', '1.800', '0.1674', '1.800', '0.0816', '7.000', '0.7076', 1, 1, 1, 1, 1727279239.5715241]
VI_after__Init : ['1.202', '0.1572', '1.800', '0.1674', '1.801', '0.0761', '7.000', '0.7076', 1, 1, 1, 1, 1727279248.334895]
VI_at__the_End : ['1.202', '0.5011', '1.800', '0.1362', '1.802', '0.1110', '7.000', '0.7086', 1, 1, 1, 1, 1727279313.1728454]