TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_50_36
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-012-011-09 | FUSED_ID : 6359364768406487225
  IC_TEMP :  -53.65 | VDDM : 1128.94 | AUX_INT :   -6.26 | CsaBias :   83.55
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 6.89455e-04 / 2
  ADC_P0  : -6.25973e-03 ± 1.77321e-02
  ADC_P1  : 8.22855e-03 ± 4.28073e-04
  ADC_P2  : -5.83677e-06 ± 2.03824e-06
  CSA_Chi2/NDF : 9.38869e-05 / 2
  CSA_P0  : 6.05576e-02 ± 6.46286e-03
  CSA_P1  : 9.93730e-03 ± 4.86930e-04
  CSA_P2  : -4.46206e-05 ± 7.41537e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [19, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [0, 43]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2312', '1.800', '0.1745', '1.800', '0.0866', '7.000', '0.7085', 1, 1, 1, 1, 1727279436.50744]
VI_after__Init : ['1.202', '0.2312', '1.800', '0.1745', '1.800', '0.0786', '7.000', '0.7077', 1, 1, 1, 1, 1727279444.6118255]
VI_at__the_End : ['1.201', '0.5039', '1.800', '0.1409', '1.800', '0.1114', '7.000', '0.7085', 1, 1, 1, 1, 1727279508.60776]