TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_52_15
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-012-012-09 | FUSED_ID : 6359364768406487241
  IC_TEMP :  -59.47 | VDDM : 1120.76 | AUX_INT :   -9.70 | CsaBias :   82.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43431e-03 / 2
  ADC_P0  : -9.70466e-03 ± 2.56308e-02
  ADC_P1  : 8.48553e-03 ± 6.25652e-04
  ADC_P2  : -6.32720e-06 ± 3.03935e-06
  CSA_Chi2/NDF : 1.37545e-04 / 2
  CSA_P0  : 6.01846e-02 ± 7.82248e-03
  CSA_P1  : 1.01111e-02 ± 5.89368e-04
  CSA_P2  : -4.94485e-05 ± 8.97537e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [32]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.4994', '1.800', '0.1430', '1.800', '0.1000', '7.000', '0.7078', 1, 1, 1, 1, 1727279535.114843]
VI_after__Init : ['1.201', '0.5001', '1.800', '0.1432', '1.800', '0.0947', '7.000', '0.7078', 1, 1, 1, 1, 1727279543.129287]
VI_at__the_End : ['1.201', '0.4968', '1.800', '0.1399', '1.804', '0.1142', '7.000', '0.7084', 1, 1, 1, 1, 1727279604.8194935]