TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_53_52
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-012-013-09 | FUSED_ID : 6359364768406487257
  IC_TEMP :  -58.87 | VDDM : 1130.96 | AUX_INT :   -8.71 | CsaBias :   78.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37915e-03 / 2
  ADC_P0  : -8.70630e-03 ± 2.51620e-02
  ADC_P1  : 8.76291e-03 ± 6.41965e-04
  ADC_P2  : -6.55472e-06 ± 3.24661e-06
  CSA_Chi2/NDF : 9.26976e-05 / 2
  CSA_P0  : 6.28443e-02 ± 6.42180e-03
  CSA_P1  : 1.02469e-02 ± 4.83836e-04
  CSA_P2  : -4.85484e-05 ± 7.36825e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [78]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [14, 42, 78]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3030', '1.800', '0.1267', '1.800', '0.0882', '7.000', '0.7086', 1, 1, 1, 1, 1727279632.653277]
VI_after__Init : ['1.201', '0.3031', '1.800', '0.1267', '1.799', '0.0810', '7.000', '0.7077', 1, 1, 1, 1, 1727279640.752735]
VI_at__the_End : ['1.201', '0.5101', '1.800', '0.1433', '1.804', '0.1114', '7.000', '0.7084', 1, 1, 1, 1, 1727279704.5958107]