TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_57_08
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-012-015-09 | FUSED_ID : 6359364768406487289
  IC_TEMP :  -52.08 | VDDM : 1127.78 | AUX_INT :   -7.83 | CsaBias :   87.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02494e-03 / 2
  ADC_P0  : -7.82571e-03 ± 2.16621e-02
  ADC_P1  : 8.04124e-03 ± 5.10017e-04
  ADC_P2  : -5.40436e-06 ± 2.37985e-06
  CSA_Chi2/NDF : 7.25468e-05 / 2
  CSA_P0  : 5.81274e-02 ± 5.68109e-03
  CSA_P1  : 9.48310e-03 ± 4.28029e-04
  CSA_P2  : -3.92492e-05 ± 6.51837e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2321', '1.800', '0.1578', '1.800', '0.0851', '7.000', '0.7077', 1, 1, 1, 1, 1727279828.4923353]
VI_after__Init : ['1.201', '0.2320', '1.800', '0.1578', '1.800', '0.0796', '7.000', '0.7076', 1, 1, 1, 1, 1727279836.5906882]
VI_at__the_End : ['1.201', '0.4968', '1.800', '0.1361', '1.799', '0.1104', '7.000', '0.7085', 1, 1, 1, 1, 1727279899.7910085]