TEST_NAME : Wafer
TEST_DATE : 24_09_25-17_58_46
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-012-016-14 | FUSED_ID : 6359364768406487310
  IC_TEMP :  -59.14 | VDDM : 1126.40 | AUX_INT :   -8.40 | CsaBias :   76.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.18610e-03 / 2
  ADC_P0  : -8.40081e-03 ± 2.32827e-02
  ADC_P1  : 8.58222e-03 ± 5.74528e-04
  ADC_P2  : -6.77930e-06 ± 2.80342e-06
  CSA_Chi2/NDF : 9.85951e-05 / 2
  CSA_P0  : 5.76982e-02 ± 6.62293e-03
  CSA_P1  : 9.67233e-03 ± 4.98990e-04
  CSA_P2  : -4.42328e-05 ± 7.59902e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [14, 103]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [87]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3669', '1.800', '0.1436', '1.800', '0.0984', '7.000', '0.7076', 1, 1, 1, 1, 1727279926.2222013]
VI_after__Init : ['1.202', '0.3669', '1.800', '0.1436', '1.799', '0.0926', '7.000', '0.7079', 1, 1, 1, 1, 1727279935.0025733]
VI_at__the_End : ['1.201', '0.4862', '1.800', '0.1394', '1.799', '0.1137', '7.000', '0.7088', 1, 1, 1, 1, 1727279992.7275436]