TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_05_19
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-012-020-14 | FUSED_ID : 6359364768406487374
  IC_TEMP :  -50.73 | VDDM : 1122.42 | AUX_INT :   -7.14 | CsaBias :   72.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.03752e-03 / 2
  ADC_P0  : -7.13508e-03 ± 2.17975e-02
  ADC_P1  : 8.02885e-03 ± 5.12684e-04
  ADC_P2  : -5.56817e-06 ± 2.37742e-06
  CSA_Chi2/NDF : 6.43782e-05 / 2
  CSA_P0  : 5.94667e-02 ± 5.35170e-03
  CSA_P1  : 9.37044e-03 ± 4.03212e-04
  CSA_P2  : -3.72876e-05 ± 6.14044e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [0, 18, 30, 71, 75]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3246', '1.800', '0.1313', '1.800', '0.0928', '7.000', '0.7088', 1, 1, 1, 1, 1727280318.9383993]
VI_after__Init : ['1.202', '0.3247', '1.800', '0.1313', '1.801', '0.0854', '7.000', '0.7078', 1, 1, 1, 1, 1727280326.8947914]
VI_at__the_End : ['1.201', '0.5010', '1.800', '0.1380', '1.803', '0.1102', '7.000', '0.7085', 1, 1, 1, 1, 1727280389.7442691]