TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_11_50
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-012-024-14 | FUSED_ID : 6359364768406487438
  IC_TEMP :  -57.28 | VDDM : 1100.67 | AUX_INT :   -8.53 | CsaBias :   74.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.57227e-03 / 2
  ADC_P0  : -8.52654e-03 ± 2.68781e-02
  ADC_P1  : 8.32107e-03 ± 6.49958e-04
  ADC_P2  : -5.88468e-06 ± 3.12093e-06
  CSA_Chi2/NDF : 1.03023e-04 / 2
  CSA_P0  : 5.90095e-02 ± 6.77003e-03
  CSA_P1  : 9.70502e-03 ± 5.10073e-04
  CSA_P2  : -4.20158e-05 ± 7.76780e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [37, 86]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2388', '1.799', '0.1530', '1.799', '0.0894', '7.000', '0.7088', 1, 1, 1, 1, 1727280710.3476083]
VI_after__Init : ['1.202', '0.2387', '1.800', '0.1530', '1.800', '0.0816', '7.000', '0.7079', 1, 1, 1, 1, 1727280718.4219458]
VI_at__the_End : ['1.201', '0.4981', '1.800', '0.1384', '1.799', '0.1111', '7.000', '0.7085', 1, 1, 1, 1, 1727280777.3525903]