TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_16_44
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-012-027-14 | FUSED_ID : 6359364768406487486
  IC_TEMP :  -50.49 | VDDM : 1128.02 | AUX_INT :  -10.65 | CsaBias :   85.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.79452e-03 / 2
  ADC_P0  : -1.06542e-02 ± 2.87329e-02
  ADC_P1  : 8.09802e-03 ± 6.73975e-04
  ADC_P2  : -5.38400e-06 ± 3.15965e-06
  CSA_Chi2/NDF : 6.22318e-05 / 2
  CSA_P0  : 5.86623e-02 ± 5.26173e-03
  CSA_P1  : 8.98534e-03 ± 3.96433e-04
  CSA_P2  : -2.91116e-05 ± 6.03721e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [38, 39]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [54]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2226', '1.800', '0.1314', '1.799', '0.0784', '7.000', '0.7078', 1, 1, 1, 1, 1727281003.8247442]
VI_after__Init : ['1.201', '0.2227', '1.800', '0.1314', '1.799', '0.0782', '7.000', '0.7082', 1, 1, 1, 1, 1727281011.7871857]
VI_at__the_End : ['1.201', '0.5043', '1.800', '0.1349', '1.800', '0.1093', '7.000', '0.7086', 1, 1, 1, 1, 1727281075.7073288]