TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_54_15
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-013-004-04 | FUSED_ID : 6359364768406491204
  IC_TEMP :  -53.53 | VDDM : 1122.44 | AUX_INT :   -9.00 | CsaBias :   79.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46392e-03 / 2
  ADC_P0  : -9.00079e-03 ± 2.59454e-02
  ADC_P1  : 8.14830e-03 ± 6.18132e-04
  ADC_P2  : -5.47530e-06 ± 2.92339e-06
  CSA_Chi2/NDF : 9.12404e-05 / 2
  CSA_P0  : 5.84916e-02 ± 6.37112e-03
  CSA_P1  : 9.67173e-03 ± 4.80018e-04
  CSA_P2  : -4.16606e-05 ± 7.31011e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [9]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4225', '1.800', '0.1589', '1.799', '0.0930', '7.000', '0.7082', 1, 1, 1, 1, 1727283254.8243043]
VI_after__Init : ['1.201', '0.4228', '1.800', '0.1589', '1.800', '0.0872', '7.000', '0.7080', 1, 1, 1, 1, 1727283262.8156972]
VI_at__the_End : ['1.201', '0.4996', '1.800', '0.1374', '1.800', '0.1105', '7.000', '0.7087', 1, 1, 1, 1, 1727283323.5660179]