TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_50_59
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-013-006-04 | FUSED_ID : 6359364768406491236
  IC_TEMP :  -60.11 | VDDM : 1118.87 | AUX_INT :   -7.89 | CsaBias :   72.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35927e-03 / 2
  ADC_P0  : -7.89064e-03 ± 2.50371e-02
  ADC_P1  : 8.05795e-03 ± 6.02754e-04
  ADC_P2  : -4.81359e-06 ± 2.87653e-06
  CSA_Chi2/NDF : 1.49212e-04 / 2
  CSA_P0  : 5.84177e-02 ± 8.14749e-03
  CSA_P1  : 1.00946e-02 ± 6.13854e-04
  CSA_P2  : -4.95065e-05 ± 9.34827e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [42]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [110]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3543', '1.800', '0.1359', '1.799', '0.0922', '7.000', '0.7079', 1, 1, 1, 1, 1727283058.722323]
VI_after__Init : ['1.201', '0.3545', '1.800', '0.1359', '1.800', '0.0871', '7.000', '0.7080', 1, 1, 1, 1, 1727283066.8126876]
VI_at__the_End : ['1.201', '0.4936', '1.800', '0.1376', '1.807', '0.1148', '7.000', '0.7087', 1, 1, 1, 1, 1727283129.5938444]