TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_44_27
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-013-010-04 | FUSED_ID : 6359364768406491300
  IC_TEMP :  -60.29 | VDDM : 1131.78 | AUX_INT :   -8.10 | CsaBias :   85.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.01269e-03 / 2
  ADC_P0  : -8.10324e-03 ± 2.14802e-02
  ADC_P1  : 8.54738e-03 ± 5.25359e-04
  ADC_P2  : -6.89558e-06 ± 2.53977e-06
  CSA_Chi2/NDF : 9.95825e-05 / 2
  CSA_P0  : 5.95294e-02 ± 6.65601e-03
  CSA_P1  : 9.61495e-03 ± 5.01482e-04
  CSA_P2  : -4.20130e-05 ± 7.63698e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [35]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3501', '1.800', '0.1277', '1.799', '0.0973', '7.000', '0.7079', 1, 1, 1, 1, 1727282667.1074388]
VI_after__Init : ['1.201', '0.3501', '1.800', '0.1278', '1.799', '0.0916', '7.000', '0.7080', 1, 1, 1, 1, 1727282675.105756]
VI_at__the_End : ['1.201', '0.4950', '1.800', '0.1357', '1.799', '0.1121', '7.000', '0.7087', 1, 1, 1, 1, 1727282735.522194]