TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_39_33
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-013-013-04 | FUSED_ID : 6359364768406491348
  IC_TEMP :  -52.83 | VDDM : 1132.52 | AUX_INT :  -52.29 | CsaBias :   44.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.48490e-03 / 2
  ADC_P0  : -5.22888e-02 ± 2.86397e-02
  ADC_P1  : 8.86482e-03 ± 6.90657e-04
  ADC_P2  : -7.32649e-06 ± 3.27591e-06
  CSA_Chi2/NDF : 9.47990e-05 / 2
  CSA_P0  : 5.93588e-02 ± 6.49418e-03
  CSA_P1  : 9.64826e-03 ± 4.89289e-04
  CSA_P2  : -4.22702e-05 ± 7.45130e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [19, 67, 80]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [88, 96, 123]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2655', '1.800', '0.1492', '1.799', '0.0935', '7.000', '0.7085', 1, 1, 1, 1, 1727282372.8632307]
VI_after__Init : ['1.201', '0.2655', '1.800', '0.1492', '1.799', '0.0868', '7.000', '0.7084', 1, 1, 1, 1, 1727282380.8164983]
VI_at__the_End : ['1.201', '0.4975', '1.800', '0.1386', '1.801', '0.1121', '7.000', '0.7087', 1, 1, 1, 1, 1727282440.394949]