TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_37_55
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-013-014-04 | FUSED_ID : 6359364768406491364
  IC_TEMP :  -58.06 | VDDM : 1120.89 | AUX_INT :   -9.42 | CsaBias :   90.94
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.65534e-03 / 2
  ADC_P0  : -9.42401e-03 ± 2.75922e-02
  ADC_P1  : 7.78883e-03 ± 6.23382e-04
  ADC_P2  : -5.24166e-06 ± 2.79399e-06
  CSA_Chi2/NDF : 6.80578e-05 / 2
  CSA_P0  : 5.74482e-02 ± 5.50252e-03
  CSA_P1  : 8.87501e-03 ± 4.14575e-04
  CSA_P2  : -3.44853e-05 ± 6.31349e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [91, 94, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [72, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2851', '1.800', '0.1468', '1.800', '0.0940', '7.000', '0.7085', 1, 1, 1, 1, 1727282275.4967864]
VI_after__Init : ['1.201', '0.2850', '1.800', '0.1467', '1.801', '0.0869', '7.000', '0.7082', 1, 1, 1, 1, 1727282283.5780778]
VI_at__the_End : ['1.201', '0.4762', '1.800', '0.1350', '1.805', '0.1135', '7.000', '0.7087', 1, 1, 1, 1, 1727282348.5600588]