TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_33_02
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-013-017-03 | FUSED_ID : 6359364768406491411
  IC_TEMP :  -60.81 | VDDM : 1116.55 | AUX_INT :   -6.36 | CsaBias :   82.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.05027e-03 / 2
  ADC_P0  : -6.36287e-03 ± 2.19546e-02
  ADC_P1  : 8.12063e-03 ± 5.29515e-04
  ADC_P2  : -5.38304e-06 ± 2.51474e-06
  CSA_Chi2/NDF : 1.01914e-04 / 2
  CSA_P0  : 5.85535e-02 ± 6.73346e-03
  CSA_P1  : 9.49176e-03 ± 5.07318e-04
  CSA_P2  : -4.25074e-05 ± 7.72585e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3210', '1.800', '0.1367', '1.800', '0.0930', '7.000', '0.7079', 1, 1, 1, 1, 1727281982.127787]
VI_after__Init : ['1.201', '0.3214', '1.800', '0.1368', '1.800', '0.0873', '7.000', '0.7079', 1, 1, 1, 1, 1727281990.063154]
VI_at__the_End : ['1.201', '0.4825', '1.800', '0.1394', '1.799', '0.1143', '7.000', '0.7088', 1, 1, 1, 1, 1727282055.8539433]