TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_31_24
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-013-018-03 | FUSED_ID : 6359364768406491427
  IC_TEMP :  -62.46 | VDDM : 1126.84 | AUX_INT :   -8.53 | CsaBias :   75.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17895e-03 / 2
  ADC_P0  : -8.52977e-03 ± 2.32052e-02
  ADC_P1  : 8.42886e-03 ± 5.60985e-04
  ADC_P2  : -6.58917e-06 ± 2.68303e-06
  CSA_Chi2/NDF : 1.67661e-04 / 2
  CSA_P0  : 5.86610e-02 ± 8.63651e-03
  CSA_P1  : 1.00288e-02 ± 6.50698e-04
  CSA_P2  : -4.97663e-05 ± 9.90937e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [4]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [82]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.0926', '1.800', '0.1257', '1.800', '0.0880', '7.000', '0.7078', 1, 1, 1, 1, 1727281884.1403465]
VI_after__Init : ['1.201', '0.0926', '1.800', '0.1256', '1.800', '0.0825', '7.000', '0.7079', 1, 1, 1, 1, 1727281892.3347147]
VI_at__the_End : ['1.201', '0.4941', '1.800', '0.1380', '1.800', '0.1132', '7.000', '0.7085', 1, 1, 1, 1, 1727281955.812811]