TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_29_45
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-013-019-03 | FUSED_ID : 6359364768406491443
  IC_TEMP :  -55.52 | VDDM : 1130.18 | AUX_INT :   -6.84 | CsaBias :   88.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.09052e-04 / 2
  ADC_P0  : -6.84489e-03 ± 1.92260e-02
  ADC_P1  : 7.97591e-03 ± 4.49800e-04
  ADC_P2  : -5.43420e-06 ± 2.07852e-06
  CSA_Chi2/NDF : 6.99063e-05 / 2
  CSA_P0  : 5.91828e-02 ± 5.57674e-03
  CSA_P1  : 9.28091e-03 ± 4.20167e-04
  CSA_P2  : -3.74525e-05 ± 6.39865e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1706', '1.800', '0.1415', '1.800', '0.0846', '7.000', '0.7086', 1, 1, 1, 1, 1727281785.5418718]
VI_after__Init : ['1.201', '0.1706', '1.800', '0.1414', '1.800', '0.0772', '7.000', '0.7082', 1, 1, 1, 1, 1727281793.8092268]
VI_at__the_End : ['1.201', '0.4924', '1.800', '0.1351', '1.799', '0.1125', '7.000', '0.7089', 1, 1, 1, 1, 1727281858.3103285]