TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_28_08
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-013-020-03 | FUSED_ID : 6359364768406491459
  IC_TEMP :  -51.63 | VDDM : 1128.76 | AUX_INT :  -16.11 | CsaBias :   80.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46826e-03 / 2
  ADC_P0  : -1.61131e-02 ± 2.64451e-02
  ADC_P1  : 8.12621e-03 ± 6.24092e-04
  ADC_P2  : -5.57079e-06 ± 2.90653e-06
  CSA_Chi2/NDF : 8.00592e-05 / 2
  CSA_P0  : 6.04626e-02 ± 5.96799e-03
  CSA_P1  : 9.59580e-03 ± 4.49645e-04
  CSA_P2  : -4.04005e-05 ± 6.84756e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [48]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2112', '1.800', '0.1705', '1.800', '0.0914', '7.000', '0.7079', 1, 1, 1, 1, 1727281688.0891826]
VI_after__Init : ['1.201', '0.2112', '1.800', '0.1706', '1.800', '0.0857', '7.000', '0.7080', 1, 1, 1, 1, 1727281696.3405287]
VI_at__the_End : ['1.201', '0.5015', '1.800', '0.1363', '1.803', '0.1114', '7.000', '0.7090', 1, 1, 1, 1, 1727281759.752777]