TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_26_30
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-013-021-03 | FUSED_ID : 6359364768406491475
  IC_TEMP :  -56.07 | VDDM : 1125.80 | AUX_INT :   -8.23 | CsaBias :   91.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10552e-03 / 2
  ADC_P0  : -8.22623e-03 ± 2.24951e-02
  ADC_P1  : 8.37606e-03 ± 5.48462e-04
  ADC_P2  : -6.02195e-06 ± 2.64988e-06
  CSA_Chi2/NDF : 9.81541e-05 / 2
  CSA_P0  : 5.90123e-02 ± 6.60810e-03
  CSA_P1  : 9.91870e-03 ± 4.97873e-04
  CSA_P2  : -4.38150e-05 ± 7.58201e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [23, 45]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1558', '1.800', '0.1628', '1.799', '0.0857', '7.000', '0.7080', 1, 1, 1, 1, 1727281590.432541]
VI_after__Init : ['1.202', '0.1562', '1.800', '0.1599', '1.801', '0.0782', '7.000', '0.7079', 1, 1, 1, 1, 1727281598.581944]
VI_at__the_End : ['1.201', '0.5060', '1.800', '0.1387', '1.800', '0.1123', '7.000', '0.7086', 1, 1, 1, 1, 1727281663.5039787]