TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_24_52
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-013-022-03 | FUSED_ID : 6359364768406491491
  IC_TEMP :  -55.65 | VDDM : 1131.11 | AUX_INT :   -7.01 | CsaBias :   86.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.31224e-04 / 2
  ADC_P0  : -7.01255e-03 ± 1.94820e-02
  ADC_P1  : 7.84871e-03 ± 4.47007e-04
  ADC_P2  : -5.31503e-06 ± 2.02680e-06
  CSA_Chi2/NDF : 8.93507e-05 / 2
  CSA_P0  : 5.68334e-02 ± 6.30480e-03
  CSA_P1  : 9.61702e-03 ± 4.75021e-04
  CSA_P2  : -3.99540e-05 ± 7.23401e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  1
 | P_BROKEN_FAST :  [18]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2659', '1.800', '0.1498', '1.799', '0.0947', '7.000', '0.7087', 1, 1, 1, 1, 1727281492.1250262]
VI_after__Init : ['1.201', '0.2661', '1.800', '0.1497', '1.800', '0.0873', '7.000', '0.7080', 1, 1, 1, 1, 1727281501.075282]
VI_at__the_End : ['1.201', '0.5000', '1.800', '0.1356', '1.799', '0.1100', '7.000', '0.7087', 1, 1, 1, 1, 1727281560.5198016]