TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_23_14
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-013-023-03 | FUSED_ID : 6359364768406491507
  IC_TEMP :  -56.88 | VDDM : 1127.40 | AUX_INT :   -8.54 | CsaBias :   75.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.46015e-03 / 2
  ADC_P0  : -8.53741e-03 ± 2.59309e-02
  ADC_P1  : 8.42057e-03 ± 6.43513e-04
  ADC_P2  : -5.65101e-06 ± 3.16757e-06
  CSA_Chi2/NDF : 1.53112e-04 / 2
  CSA_P0  : 5.90783e-02 ± 8.25330e-03
  CSA_P1  : 1.01553e-02 ± 6.21826e-04
  CSA_P2  : -4.74238e-05 ± 9.46968e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  1
 | N_BROKEN_FAST :  [39]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [6, 59, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2527', '1.800', '0.1675', '1.800', '0.0950', '7.000', '0.7089', 1, 1, 1, 1, 1727281394.0844]
VI_after__Init : ['1.201', '0.2529', '1.800', '0.1674', '1.800', '0.0870', '7.000', '0.7082', 1, 1, 1, 1, 1727281402.9306796]
VI_at__the_End : ['1.202', '0.5038', '1.800', '0.1390', '1.800', '0.1123', '7.000', '0.7085', 1, 1, 1, 1, 1727281469.2646935]