TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_19_59
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-013-025-03 | FUSED_ID : 6359364768406491539
  IC_TEMP :  -52.83 | VDDM : 1109.53 | AUX_INT :   -7.95 | CsaBias :   87.96
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.54168e-04 / 2
  ADC_P0  : -7.95121e-03 ± 2.08486e-02
  ADC_P1  : 8.06543e-03 ± 4.82753e-04
  ADC_P2  : -6.03639e-06 ± 2.21111e-06
  CSA_Chi2/NDF : 6.91533e-05 / 2
  CSA_P0  : 5.76623e-02 ± 5.54662e-03
  CSA_P1  : 8.87018e-03 ± 4.17898e-04
  CSA_P2  : -2.97723e-05 ± 6.36409e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3057', '1.800', '0.1378', '1.800', '0.0877', '7.000', '0.7079', 1, 1, 1, 1, 1727281199.4310527]
VI_after__Init : ['1.201', '0.3058', '1.800', '0.1371', '1.800', '0.0821', '7.000', '0.7080', 1, 1, 1, 1, 1727281207.4703715]
VI_at__the_End : ['1.201', '0.4953', '1.800', '0.1342', '1.800', '0.1091', '7.000', '0.7087', 1, 1, 1, 1, 1727281270.1387174]