TEST_NAME : Wafer
TEST_DATE : 24_09_25-18_57_30
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-014-003-10 | FUSED_ID : 6359364768406495290
  IC_TEMP :  -54.51 | VDDM : 1123.79 | AUX_INT :   -7.65 | CsaBias :   78.32
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.61600e-04 / 2
  ADC_P0  : -7.64796e-03 ± 1.97876e-02
  ADC_P1  : 8.66875e-03 ± 4.89690e-04
  ADC_P2  : -7.21637e-06 ± 2.39317e-06
  CSA_Chi2/NDF : 8.19155e-05 / 2
  CSA_P0  : 5.73165e-02 ± 6.03678e-03
  CSA_P1  : 9.29568e-03 ± 4.54828e-04
  CSA_P2  : -3.63426e-05 ± 6.92649e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [7, 16, 58, 79]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1798', '1.800', '0.1620', '1.799', '0.0863', '7.000', '0.7079', 1, 1, 1, 1, 1727283450.7232206]
VI_after__Init : ['1.202', '0.1797', '1.800', '0.1620', '1.799', '0.0807', '7.000', '0.7079', 1, 1, 1, 1, 1727283458.7506225]
VI_at__the_End : ['1.202', '0.4931', '1.800', '0.1359', '1.807', '0.1095', '7.000', '0.7085', 1, 1, 1, 1, 1727283521.1409626]