TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_00_46
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-014-005-10 | FUSED_ID : 6359364768406495322
  IC_TEMP :  -54.24 | VDDM : 1136.70 | AUX_INT :   -7.39 | CsaBias :   97.88
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.16730e-03 / 2
  ADC_P0  : -7.39497e-03 ± 2.31765e-02
  ADC_P1  : 8.16367e-03 ± 5.64506e-04
  ADC_P2  : -5.04759e-06 ± 2.72308e-06
  CSA_Chi2/NDF : 7.83229e-05 / 2
  CSA_P0  : 5.86740e-02 ± 5.90292e-03
  CSA_P1  : 9.63138e-03 ± 4.44742e-04
  CSA_P2  : -3.79795e-05 ± 6.77290e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  0
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1961', '1.800', '0.1702', '1.799', '0.0848', '7.000', '0.7076', 1, 1, 1, 1, 1727283646.1182818]
VI_after__Init : ['1.201', '0.1962', '1.800', '0.1702', '1.800', '0.0795', '7.000', '0.7076', 1, 1, 1, 1, 1727283654.9076214]
VI_at__the_End : ['1.201', '0.5115', '1.800', '0.1412', '1.803', '0.1081', '7.000', '0.7084', 1, 1, 1, 1, 1727283718.490879]