TEST_NAME : Wafer
TEST_DATE : 24_09_25-19_05_39
OPERATOR  : Carmen S.; Oleksandr S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-032-014-008-10 | FUSED_ID : 6359364768406495370
  IC_TEMP :  -53.38 | VDDM : 1126.47 | AUX_INT :   -9.43 | CsaBias :   87.93
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.49823e-03 / 2
  ADC_P0  : -9.43322e-03 ± 2.62285e-02
  ADC_P1  : 8.18287e-03 ± 6.21626e-04
  ADC_P2  : -5.77861e-06 ± 2.92661e-06
  CSA_Chi2/NDF : 1.14833e-04 / 2
  CSA_P0  : 5.87993e-02 ± 7.14752e-03
  CSA_P1  : 1.00126e-02 ± 5.38514e-04
  CSA_P2  : -4.50288e-05 ± 8.20093e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [67, 82]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [29, 35, 63, 106, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3442', '1.800', '0.1526', '1.799', '0.0891', '7.000', '0.7072', 1, 1, 1, 1, 1727283939.5858846]
VI_after__Init : ['1.201', '0.3441', '1.800', '0.1526', '1.800', '0.0834', '7.000', '0.7076', 1, 1, 1, 1, 1727283947.8113012]
VI_at__the_End : ['1.201', '0.5073', '1.800', '0.1391', '1.802', '0.1109', '7.000', '0.7080', 1, 1, 1, 1, 1727284007.6907353]